Persistent URL of this record https://hdl.handle.net/1887/74527
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Conductance and gating effects at sputtered oxide interfaces
90° off-axis sputter deposition. The conductance properties of the interfaces were modulated by applying external electric fields in different geometries, namely back-gating (applying an electric field to the back side of the substrate) and ionic liquid gating (which applies an electric field on the side of the LaAlO3).
- All authors
- Yin, C.
- Supervisor
- Aarts, J.
- Committee
- Caviglia, A.D.; Santamaria, J.; Eliel, E.R.; Oosterkamp, T.H.
- Qualification
- Doctor (dr.)
- Awarding Institution
- Leiden Institute of Physics (LION), Faculty of Science, Leiden University
- Date
- 2019-07-03
- Title of host publication
- Casimir PhD Series
- ISBN (print)
- 9789085934073
Publication Series
- Name
- 2019-24
Funding
- Sponsorship
- China Scholarship Council