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Pixel super‐resolution interference pattern sensing via the aliasing effect for laser frequency metrology

Wan, L.; Yu, T.; Zhao, d.; Löffler, W. (2023)

Pixel super‐resolution interference pattern sensing via the aliasing effect for laser frequency metrology

Article / Letter to editor

All authors: Wan, L.; Yu, T.; Zhao, d.; Löffler, W.

Date: 2023-07-19

Journal: Laser & Photonics Reviews

Volume: 17

Issue: 10

DOI: doi:10.1002/lpor.202200994

Link: http://dx.doi.org/10.1002/lpor.202200994