Persistent URL of this record https://hdl.handle.net/1887/3633957
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- A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
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- open access
- Full text at publishers site
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A survey of recent developments in testability, safety and security of RISC-V processors
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- All authors
- Anders, J.; Andreu, P.; Becker, B.; Becker, S.; Cantoro, R.; Deligiannis, N.; Elhamawy, N.; Faller, T.; Hernandez, C.; Mentens, N.; Namazi Rizi, M.; Polian, I.; Sajadi, A.; Sauer, M.; Schwachhofer, D.; Sonze Reorda, M.; Stefanov, T.P.; Tuzov, I.; Wagner, S.; Zidaric, N.
- Date
- 2023-07-12
- Title of host publication
- IEEE European test symposium (ETS)
- Pages
- 1 - 10
- ISBN (print)
- 9798350336351
- ISBN (electronic)
- 9798350336344
Conference
- Conference
- 2023 IEEE European Test Symposium (ETS)
- Date
- 2023-05-22 - 2023-05-26
- Location
- Venezia, Italy