Persistent URL of this record https://hdl.handle.net/1887/3620789
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- Ultramicroscopy_218_2020_113091
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Sub-pixel electron detection using a convolutional neural network
- All authors
- Schayck, J.P. van; Genderen, E. van; Maddox, E.; Roussel, L.; Boulanger, H.; Fröjdh, E.; Abrahams, J.P.; Peters, P.J.; Ravelli, R.B.G.
- Date
- 2020-11-01
- Journal
- Ultramicroscopy
- Volume
- 218