Persistent URL of this record https://hdl.handle.net/1887/3570994
Documents
-
- Download
- 3575637.3575652
- Publisher's Version
- open access
- Full text at publishers site
In Collections
This item can be found in the following collections:
Feature selection for fault detection and prediction based on event log analysis
- All authors
- Zhong, L.; Leeuwen, M, van; Li, Z.
- Date
- 2022-11-29
- Journal
- ACM SIGKDD Explorations
- Volume
- 24
- Issue
- 2
- Pages
- 96 - 104