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(1 - 3 of 3)
Nonuniversal transverse electron mean free path through few-layer graphene
Geelen, D.; Jobst, J.; Krasovskii, E.E.; Molen, S.J. van der; Tromp, R.M. 2019
Nonuniversal transverse electron mean free path through few-layer graphene
Article / Letter to editor
open access
Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation
Thete, A.; Geelen, D.; Molen, S.J. van der; Tromp, R.M. 2017
Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation
Article / Letter to editor
open access
Intrinsic Instability of Aberration-Corrected Electron Microscopes
Schramm, S.; Molen, S.J. van der; Tromp, R.M. 2012
Intrinsic Instability of Aberration-Corrected Electron Microscopes
Article / Letter to editor
open access