Electron microscopy has become an extremely important techniquein a wide variety of elds. The resolving power is vastly superiorto light microscopes and electron microscopy has proven tobe valuable... Show moreElectron microscopy has become an extremely important techniquein a wide variety of elds. The resolving power is vastly superiorto light microscopes and electron microscopy has proven tobe valuable in elds ranging from archaeology and geology to biology andcondensed-matter physics.A major disadvantage is that the electron energy used in conventional ElectronMicroscopy (EM) ranges from 10’s to 100’s of keV. Such energetic electronscan signicantly damage the specimen. This is especially relevant in thestudy of biological samples and organic materials in general. Major eorts arebeing made to avoid this radiation damage from interfering with the studyof such materials. There are several approaches to minimize damage in EM.These include developing better detectors such that lower electron doses aresucient to form an image, and lowering the electron energies to several keV.In this dissertation I present the development of, and measurements with, atransmission electron microscope that uses electron energies ve orders ofmagnitude lower than in conventional Transmission Electron Microscopes(TEMs). The energies we use are in the order of a few eV. Hence, we call ourtechnique ’eV-TEM’. Show less
By combining low-energy electron microscopy (LEEM) with pulsed laser deposition (PLD), we have created a unique set-up to study the first stages of growth of complex metal oxides. We... Show more By combining low-energy electron microscopy (LEEM) with pulsed laser deposition (PLD), we have created a unique set-up to study the first stages of growth of complex metal oxides. We demonstrate this by investigating the growth of SrTiO3 (STO) and LaAlO3 (LAO) on STO in real-time. We follow growth by monitoring the intensity and the full-width-half-maximum (FWHM) of the specular diffracted beam at various energies. For layer-by-layer growth, we find the anticipated intensity peaks at the completion of each layer, and an oscillatory FWHM with the maximum at half-layer coverage. In the LAO on STO case, for optimal growth conditions and a LAO thickness above the critical thickness of 4 unit cells the interface between the band insulators shows conductivity. We obtain an electronic fingerprint of the growing material, by measuring the intensity of the specular beam as a function of energy at regular intervals during growth. Extending this fingerprint with the intensity dependence on the momentum parallel to the surface allows us to extract the band dispersion of unoccupied electron states of the sample surface. Significant differences in the unoccupied band structure develop between samples which are conducting and non-conducting. Show less
Low Energy Electron Microscopy (LEEM) is a microscopy technique typically used to study surface processes. The sample is illuminated with a parallel beam of electrons under normal incidence and the... Show moreLow Energy Electron Microscopy (LEEM) is a microscopy technique typically used to study surface processes. The sample is illuminated with a parallel beam of electrons under normal incidence and the reflected electrons are projected onto a pixelated detector, where an image is formed. In the first part of this thesis, we use LEEM to study the behavior of submonolayers of gold on Si(111). After a thorough analysis of the Si-Au system, we describe the behavior of these (sub)monolayers when exposed to alkanethiols. In the second part of this thesis we move away from pure surface physics and introduce two new applications for LEEM. The first of these, Low-Energy Electron Potentiometry (LEEP), can be used to visualize electrical conductance. We show that for layered two-dimensional materials we can obtain a higher resolution in LEEP experiments. Finally, in chapter 6, we present a new method to measure the dispersion relation of unoccupied states in two-dimensional layered materials. Show less