Inverse problems are problems where we want to estimate the values of certain parameters of a system given observations of the system. Such problems occur in several areas of science and... Show moreInverse problems are problems where we want to estimate the values of certain parameters of a system given observations of the system. Such problems occur in several areas of science and engineering. Inverse problems are often ill-posed, which means that the observations of the system do not uniquely define the parameters we seek to estimate, or that the solution is highly sensitive to small changes in the observation. In order to solve such problems, therefore, we need to make use of additional knowledge about the system at hand. One such prior information is given by the notion of sparsity. Sparsity refers to the knowledge that the solution to the inverse problem can be expressed as a combination of a few terms. The sparsity of a solution can be controlled explicitly or implicitly. An explicit way to induce sparsity is to minimize the number of non-zero terms in the solution. Implicit use of sparsity can be made, for e.g., by making adjustments to the algorithm used to arrive at the solution.In this thesis we studied various inverse problems that arise in different application areas, such as tomographic imaging and equation learning for biology, and showed how ideas of sparsity can be used in each case to design effective algorithms to solve such problems. Show less
Tilt-series alignment is crucial to obtaining high-resolution reconstructions in cryo-electron tomography. Beam-induced local deformation of the sample is hard to estimate from the low-contrast... Show moreTilt-series alignment is crucial to obtaining high-resolution reconstructions in cryo-electron tomography. Beam-induced local deformation of the sample is hard to estimate from the low-contrast sample alone, and often requires fiducial gold bead markers. The state-of-the-art approach for deformation estimation uses (semi-)manually labelled marker locations in projection data to fit the parameters of a polynomial deformation model. Manually-labelled marker locations are difficult to obtain when data are noisy or markers overlap in projection data. We propose an alternative mathematical approach for simultaneous marker localization and deformation estimation by extending a grid-free algorithm first proposed in the context of super-resolution single-molecule localization microscopy. Our approach does not require labelled marker locations; instead, we use an image-based loss where we compare the forward projection of markers with the observed data. We equip this marker localization scheme with an additional deformation estimation component and solve for a reduced number of deformation parameters. Using extensive numerical studies on marker-only samples, we show that our approach automatically finds markers and reliably estimates sample deformation without labelled marker data. We further demonstrate the applicability of our approach for a broad range of model mismatch scenarios, including experimental electron tomography data of gold markers on ice. Show less
