Persistent URL of this record https://hdl.handle.net/1887/92253
Documents
-
- Download
- Text_IR_LEI
- Publisher's Version
- open access
- Full text at publishers site
In Collections
This item can be found in the following collections:
Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis
Show less
- All authors
- Jong, T.A. de; Kok, D.N.L.; Torren, A.J.H. van der; Schopmans, H.; Tromp, R.M.; Molen, S.J. van der; Jobst, J.
- Date
- 2019-11-23
- Journal
- Ultramicroscopy
- Volume
- 213
- Pages
- 112913
- Dataset
- 10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202