Persistent URL of this record https://hdl.handle.net/1887/72540
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Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment
- All authors
- Mom, R.V.; Onderwaater, W.G.; Rost, M.J.; Jankowski, M.; Wenzel, S.; Jacobse, L.; Alkemade, P.F.A.; Vandalon, V.; Spronsen, M.A. van; Weeren, M. van; Crama, L.; Tuijn, P.C. van der; Felici, R.; Kessels, W.M.M.; Carla, F.; Frenken, J.W.M.; Groot, I.M.N.
- Date
- 2017-07-14
- Journal
- Ultramicroscopy
- Volume
- 182
- Pages
- 233 - 242