Persistent URL of this record https://hdl.handle.net/1887/56280
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Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime
- All authors
- Tewari, S.; Sabater Piqueres, C.; Kumar, M.; Stahl, S.; Crama, L.; Ruitenbeek, J.M. van
- Date
- 2017
- Journal
- Review of Scientific Instruments
- Volume
- 88
- Issue
- 9
- Pages
- 093903