Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips

Tewari, S.; Bastiaans, K.M.; Allan, M.P.; Ruitenbeek, J.M. van (2017)

Article / Letter to editor

• All authors: Tewari, S.; Bastiaans, K.M.; Allan, M.P.; Ruitenbeek, J.M. van
• Date: 2017
• Journal: Beilstein Journal of Nanotechnology
• Volume: 8
• Pages: 2389 - 2395
• DOI: doi:10.3762/bjnano.8.238
• Link: https://www.beilstein-journals.org/bjnano/articles/8/238