Persistent URL of this record https://hdl.handle.net/1887/49658
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Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance
- All authors
- Voogd, J.M. de; Spronsen, M.A. van; Kalff, F.E.; Bryant, B.; Ostojic, O.; Haan, A.M.J. den; Groot, I.M.N.; Oosterkamp, T.H.; Otte, A.F.; Rost, M.J.
- Date
- 2017
- Journal
- Ultramicroscopy
- Volume
- 181
- Pages
- 61 - 69