Persistent URL of this record https://hdl.handle.net/1887/44626
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Thickness dependence of the ground-state properties of thin films of the heavy-fermion compound CeCu_6
- All authors
- Groten, D.; Baarle, G.J.C. van; Aarts, J.; Nieuwenhuys, G.J.; Mydosh, J.A.
- Date
- 2001
- Journal
- Physical Review B
- Volume
- 64
- Pages
- 144425