Leiden University Scholarly Publications

Persistent URL of this record https://hdl.handle.net/1887/3721381

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Stein, N. van; Vermetten, D.L.; Caraffini, F.; Kononova, A.V. (2024)

Deep BIAS: detecting structural bias using explainable AI

Article in monograph or in proceedings
All authors
Stein, N. van; Vermetten, D.L.; Caraffini, F.; Kononova, A.V.
Date
2024-03-07
Title of host publication
GECCO '23 companion
Pages
455 - 458
ISBN (print)
9798400701207
DOI
doi:10.1145/3583133.3590551

Conference

Conference
GECCO '23 Companion: Companion Conference on Genetic and Evolutionary Computation
Date
2023-07-15 - 2023-07-19
Location
Lisbon, Portugal