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- Applied_Physics_Letters_123_2023_034005
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Simulation of 1/f charge noise affecting a quantum dot in a Si/SiGe structure
- All authors
- Kȩpa, M.; Focke, N.; Cywiński, Ł.,; Krzywda, J. A.
- Date
- 2023-07-17
- Journal
- Applied Physics Letters
- Volume
- 123
- Issue
- 3