NimbleAI: towards neuromorphic sensing-processing 3D-integrated chips

Xabier, I.; Abderrahmane, N.; Abella, J.; Alcaide, S.; Beyne, E.; Charles, H.P.; ... ; Zaykovankd, P. (2023)

Article in monograph or in proceedings

• All authors: Xabier, I.; Abderrahmane, N.; Abella, J.; Alcaide, S.; Beyne, E.; Charles, H.P.; Charpin, C; Chittka, L.; Dávilla, A.; Dev Gomony, M.; Erdmann, A.; Estrada, C.; Fernandez, A.; Fontanelli, A.; Flich, J; Hernan Gloriani, A.; Grosu, R.; Hernandez, C.; Ielmini, D.; Isusquiza, E.; Jackson, D.; Kooli, M.; Lepri, N.; Linares-Barranco, B.; Lachese, J.L.; Lasa, M.; Laurent, E.; Lindwer, M.; Linsenmaier, F.; Luján, M.; Masarik, K.; Mentens, N; Moreira, O.; Peres, L.; Noel, J.P.; Pourtaherian, A.; Posch, C.; Priller, P.; Prikryl, Z.; Resch, F.; Rhodes, O.; Stefanov, T.P.; Moritz, S.; Sander, S.; Taliercio, M.; Burgwal, M. van de; Plas, G. van der; Vianello, E.; Zaykovankd, P.
• Date: 2023-06-02
• Title of host publication: 2023 Design, Automation & Test in Europe conference & exhibition (DATE)
• Pages: 1 - 6
• ISBN (print): 9798350396249
• DOI: doi:10.23919/DATE56975.2023.10136952
• Conference: 26th Int. Conf. Design, Automation and Test in Europe (DATE'23)
• Date: 2023-04-17 - 2023-04-19
• Location: Antwerp