Persistent URL of this record https://hdl.handle.net/1887/3563865
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- 2207.14616
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Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
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- All authors
- Jong, T.A. de; Chen, X.; Jobst, J.; Krasovskii, E.E.; Tromp, R.M.; Molen, S.J. van der
- Date
- 2022-07-29
- Title of host publication
- arXiv
- Advanced Publication
- Yes