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A comparison of methods to harmonize cortical thickness measurements across scanners and sites
- All authors
- Sun, D.L.; Rakesh, G.; Haswell, C.C.; Logue, M.; Baird, C.L.; O'Leary, E.N.; Cotton, A.S.; Xie, H.; Tamburrino, M.; Chen, T.; Dennis, E.L.; Jahanshad, N.; Salminen, L.E.; Thomopoulos, S.I.; Rashid, F.; Ching, C.R.K.; Koch, S.B.J.; Frijling, J.L.; Nawijn, L.; Zuiden, M. van; Zhu, X.; Suarez-Jimenez, B.; Sierk, A.; Walter, H.; Manthey, A.; Stevens, J.S.; Fani, N.; Rooij, S.J.H. van; Stein, M.; Bomyea, J.; Koerte, I.K.; Choi, K.; Werff, S.J.A. van der; Vermeiren, R.R.J.M.; Herzog, J.; Lebois, L.A.M.; Baker, J.T.; Olson, E.A.; Straube, T.; Korgaonkar, M.S.; Andrew, E.; Zhu, Y.; Li, G.; Ipser, J.; Hudson, A.R.; Peverill, M.; Sambrook, K.; Gordon, E.; Baugh, L.; Forster, G.; Simons, R.M.; Simons, J.S.; Magnotta, V.; Maron-Katz, A.; Plessis, S. du; Disner, S.G.; Davenport, N.; Grupe, D.W.; Nitschke, J.B.; DeRoon-Cassini, T.A.; Fitzgerald, J.M.; Krystal, J.H.; Levy, I.; Olff, M.; Veltman, D.J.; Wang, L.; Neria, Y.; Bellis, M.D. de; Jovanovic, T.; Daniels, J.K.; Shenton, M.; Wee, N.J.A. van de; Schmahl, C.; Kaufman, M.L.; Rosso, I.M.; Sponheim, S.R.; Hofmann, D.B.; Bryant, R.A.; Fercho, K.A.; Stein, D.J.; Mueller, S.C.; Hosseini, B.; Phan, K.L.; McLaughlin, K.A.; Davidson, R.J.; Larson, C.L.; May, G.; Nelson, S.M.; Abdallah, C.G.; Gomaa, H.; Etkin, A.; Seedat, S.; Harpaz-Rotem, I.; Liberzon, I.; Erp, T.G.M. van; Quide, Y.; Wang, X.; Thompson, P.M.; Morey, R.A.
- Date
- 2022-11-01
- Journal
- NeuroImage
- Volume
- 261
- Issue
- 119509