Persistent URL of this record https://hdl.handle.net/1887/3485477
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A tomographic workflow to enable deep learning for X-ray based foreign object detection
- All authors
- Zeegers, M.T.; Leeuwen, T. van; Pelt, D.M.; Coban, S.B.; Liere, R. van; Batenburg, K.J.
- Date
- 2022-11-15
- Journal
- Expert Systems with Applications
- Volume
- 206