Persistent URL of this record https://hdl.handle.net/1887/3188409
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- Physical_Review_Applied_13_2020_044065
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Electric-double-layer-modulation microscopy
- All authors
- Namink, K.; Meng, X.H.; Koper, M.T.M.; Kukura, P.; Faez, S.
- Date
- 2020-04-24
- Journal
- Physical Review Applied
- Volume
- 13
- Issue
- 4
- Pages
- 044065