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Assessing spatial resolution, acquisition time and signal-to-noise ratio for commercial microimaging systems at 14.1, 17.6 and 22.3 T
- All authors
- Krug, J.R.; Schadewijk, R. van; Vergeldt, F.J.; Webb, A.G.; Groot, H.J.M. de; Alia, A.; As, H. van; Velders, A.H.
- Date
- 2020-07-01
- Journal
- Journal of Magnetic Resonance
- Volume
- 316