Persistent URL of this record https://hdl.handle.net/1887/3149351
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- Physical_Review_Applied_16_2021_014008
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Optical near-field electron microscopy
- All authors
- Marchand, R.; Sachl, R.; Kalbac, M.; Hof, M.; Tromp, R.M.; Amaro, M.; Molen, S.J. van der; Juffmann, T.
- Date
- 2021
- Journal
- Physical Review Applied
- Volume
- 16
- Issue
- 1