Status of the SCExAO instrument: recent technology upgrades and path to a system-level demonstrator for PSI

Lozi, J.; Guyon, O.; Vievard, S.; Sahoo, A.; Deo, V.; Jovanovic, N.; ... ; Hayashi, M. (2020)

Article in monograph or in proceedings

• All authors: Lozi, J.; Guyon, O.; Vievard, S.; Sahoo, A.; Deo, V.; Jovanovic, N.; Norris, B.; Martinod, M.-A.; Mazin, B.; Walter, A.; Fruitwala, N.; Steiger, S.; Davis, K.; Tuthill, P.; Kudo, T.; Kawahara, H.; Kotani, T.; Ireland, M.; Anagnos, T.; Schwab, C.; Cvetojevic, N.; Huby, E.; Lacour, S.; Barjot, K.; Groff, T.D.; Chilcote, J.; Kasdin, J.; Martinache, F.; Laugier, R.; N'Diaye, M.; Knight, J.; Males, J.; Bos, S.P.; Snik, F.; Doelman, D.S.; Miller, K.; Bendek, E.; Belikov, R.; Pluzhnik, E.; Currie, T.; Kuzuhara, M.; Uyama, T.; Nishikawa, J.; Murakami, N.; Hashimoto, J.; Minowa, Y.; Clergeon, C.; Ono, Y.; Takato, N.; Tamura, M.; Takami, H.; Hayashi, M.
• Editor(s): Schreiber, L.; Schmidt, D.; Vernet, E.
• Date: 2020-12-13
• Title of host publication: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
• Pages: 114480N
• DOI: doi:10.1117/12.2562832
• Link: https://ui.adsabs.harvard.edu/abs/2020SPIE11448E..0NL
• Name: 11448
• Series: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
• Conference: SPIE Astronomical Telescopes + Instrumentation 2020
• Date: 2020-12-14 - 2020-12-18
• Location: Virtual Event