Persistent URL of this record https://hdl.handle.net/1887/3134650
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- Ultramicroscopy_222_2021_113199
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Complementary LEEM and eV-TEM for imaging and spectroscopy
- All authors
- Neu, P.S.; Geelen, D.; Thete, A.; Tromp, R.M.; Molen, S.J. van der
- Date
- 2021-01-07
- Journal
- Ultramicroscopy
- Volume
- 222
- Pages
- 113199