Persistent URL of this record https://hdl.handle.net/1887/14281
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How to measure and explain achievement change in large-scale assessments: A rejoinder
- All authors
- Hickendorff, M.; Heiser, W.J.; Putten, C.M. van; Verhelst, N.D.
- Date
- 2009
- Journal
- Psychometrika
- Volume
- 74
- Pages
- 367 - 374