Developing 3D SEM in a broad biological context

Kremer, A.; Lippens, S.; Bartunkova, S.; Asselbergh, B.; Blanpain, C.; Fendrych, M.; ... ; Guerin, C.J. (2015)

Article / Letter to editor

• Correlative light and electron microscopy
• focused ion beam scanning electron microscopy
• sample preparation
• serial block-face scanning electron microscopy

• All authors: Kremer, A.; Lippens, S.; Bartunkova, S.; Asselbergh, B.; Blanpain, C.; Fendrych, M.; Goossens, A.; Holt, M.; Janssens, S.; Krols, M.; Larsimont, J.C.; Mc Guire, C.; Nowack, M.K.; Saelens, X.; Schertel, A.; Schepens, B.; Slezak, M.; Timmerman, V.; Theunis, C.; Brempt, R. van; Visser, Y.; Guerin, C.J.
• Date: 2015-08-31
• Journal: Journal of Microscopy
• Volume: 259
• Issue: 2
• Pages: 80 - 96
• DOI: doi:10.1111/jmi.12211