Non-rigid image registration to reduce beam-induced blurring of cryo-electron microscopy images

Author(s):
Nejadasl, F.K.; Karuppasamy, M.; Newman, E.R.; McGeehan, J.E.; Ravelli, R.B.G.
Published
2013
Publication type
Article / Letter to editor
cryo-electron microscopysingle particlebeam-induced movementsexposure seriesradiation damage
Date issued
2013-01-31
Language
English
Is part of
Journal of Synchrotron Radiation (2013), Vol. 20, p. 58-66
hdl
1887/99128
doi
10.1107/S0909049512044408