Image formation modeling in cryo-electron microscopy

Author(s):
Vulovic, M.; Ravelli, R.B.G.; Vliet, L.J. van; Koster, A.J. (0000-0003-1717-2549); Lazic, I.; Lucken, U.; Rullgard, H.; Oktem, O.; Rieger, B.
Published
2013
Publication type
Article / Letter to editor
Cryo-electron microscopyPhase contrastAmplitude contrastImage simulationInSilicoTEMInteraction potential
Date issued
2013-07-31
Language
English
Is part of
Journal of Structural Biology (2013), Vol. 183, no. 1, p. 19-32
hdl
1887/98793
doi
10.1016/j.jsb.2013.05.008