Image formation modeling in cryo-electron microscopy

Vulovic, M.; Ravelli, R.B.G.; Vliet, L.J. van; Koster, A.J.; Lazic, I.; Lucken, U.; ... ; Rieger, B. (2013)

Article / Letter to editor

• Cryo-electron microscopy
• Phase contrast
• Amplitude contrast
• Image simulation
• InSilicoTEM
• Interaction potential

• All authors: Vulovic, M.; Ravelli, R.B.G.; Vliet, L.J. van; Koster, A.J.; Lazic, I.; Lucken, U.; Rullgard, H.; Oktem, O.; Rieger, B.
• Date: 2013-07-31
• Journal: Journal of Structural Biology
• Volume: 183
• Issue: 1
• Pages: 19 - 32
• DOI: doi:10.1016/j.jsb.2013.05.008