Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy

Author(s):
Vulovic, M.; Franken, E.; Ravelli, R.B.G.; Vliet, L.J. van; Rieger, B.
Published
2012
Publication type
Article / Letter to editor
Transmission electron microscopyPhase contrastCTFTwofold astigmatismDefocusSoftwareThon rings
Date issued
2012-05-31
Language
English
Is part of
Ultramicroscopy (2012), Vol. 116, p. 115-134
hdl
1887/97738
doi
10.1016/j.ultramic.2012.03.004