Observations on intensity oscillations in reflection high‐energy electron diffraction during epitaxial growth of Si(001) and Ge(001)

Author(s):: Aarts, J. (0000-0002-4113-0835); Gerits, W.M.; Larsen, P.K.

Published: 1986
Publication type: Article / Letter to editor

Date issued: 1986
Language: English
Is part of: Applied Physics Letters (1986), Vol. 48, no. 14, p. 931-933
hdl: 1887/77330
doi: 10.1063/1.96662