Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

Author(s):
Mom, R.V. (0000-0002-5111-5591); Onderwaater, W.G.; Rost, M.J.; Jankowski, M.; Wenzel, S. (0000-0002-2346-6669); Jacobse, L. (0000-0002-2825-0963); Alkemade, P.F.A.; Vandalon, V.; Spronsen, M.A. van; Weeren, M. van; Crama, L.; Tuijn, P.C. van der; Felici, R.; Kessels, W.M.M.; Carla, F.; Frenken, J.W.M.; Groot, I.M.N. (0000-0001-9747-3522)
Published
2017
Publication type
Article / Letter to editor
Date issued
2017-07-14
Language
English
Is part of
Ultramicroscopy (2017), Vol. 182, p. 233-242
hdl
1887/72540
doi
10.1016/j.ultramic.2017.07.011