Real-space determination of atomic structure and bond relaxation at the NiSi_2-Si(111) interface

Author(s):
Loenen, E.J. van; Frenken, J.W.M.; Veen, J.F. van der; Valeri, S.
Published
1985
Publication type
Article / Letter to editor
Date issued
1985
Language
English
Is part of
Physical Review Letters (1985), Vol. 54, no. 8, p. 827-830
hdl
1887/71363
doi
10.1103/PhysRevLett.54.827