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Real-space determination of atomic structure and bond relaxation at the NiSi_2-Si(111) interface
- All authors
- Loenen, E.J. van; Frenken, J.W.M.; Veen, J.F. van der; Valeri, S.
- Date
- 1985
- Journal
- Physical Review Letters
- Volume
- 54
- Issue
- 8
- Pages
- 827 - 830