Atomic resolution scanning tunneling microscopy in a cryogen free dilution refrigerator at 15 mK

Author(s):: Haan, A.M.J. den; Wijts, G.H.C.J.; Galli, F. (0000-0002-1098-8150); Usenko, O.; Baarle, D.W. van; Zalm, D.J. van der; Oosterkamp, T.H. (0000-0001-6855-5190)

Published: 2014
Publication type: Article / Letter to editor

Date issued: 2014
Language: English
Is part of: Review of Scientific Instruments (2014), Vol. 85, p. 035112
hdl: 1887/62441
doi: 10.1063/1.4868684
URL: https://arxiv.org/abs/1312.6011