Method to determine defect positions below a metal surface by STM

Author(s):: Avotina, Y.S.; Kolesnichenko, Y.A.; Omelyanchouk, A.N.; Otte, A.F.; Ruitenbeek, J.M. van (0000-0003-0381-0132)

Published: 2005
Publication type: Article / Letter to editor

Date issued: 2005
Language: English
Is part of: Physical Review B (2005), Vol. 71, p. 115430
hdl: 1887/62281
doi: 10.1103/PhysRevB.71.115430