Intrinsic Instability of Aberration-Corrected Electron Microscopes

Author(s):: Schramm, S.; Molen, S.J. van der (0000-0003-3181-2055); Tromp, R.M.

Published: 2012
Publication type: Article / Letter to editor

Date issued: 2012
Language: English
Is part of: Physical Review Letters (2012), Vol. 109, no. 16, p. 163901
hdl: 1887/61296
doi: 10.1103/PhysRevLett.109.163901
URL: https://journals.aps.org/prl/abstract/10.1103/PhysRevLett.109.163901