Scanning probe microscopes go video rate and beyond
- Author(s):
- Rost, M.J.; Crama, L.; Schakel, P.; Tol, E.H. van; Velzen-Williams, G.B.E.M.; Overgauw, C.F.; Horst, H. ter; Dekker, H.; Okhuijsen, B.; Seynen, M.; Vijftigschild, A.; Han, P.; Katan, A.J.; Schoots, K.; Schumm, R.; Loo, W.A.; Oosterkamp, T.H. (0000-0001-6855-5190); Frenken, J.W.M.
- Published
- 2005
- Publication type
- Article / Letter to editor
- Date issued
- 2005
- Language
- English
- Is part of
- Review of Scientific Instruments (2005), Vol. 76, no. 18, p. 053710
- hdl
- 1887/61253
- doi
- 10.1063/1.1915288
- URL
- https://aip.scitation.org/doi/10.1063/1.1915288
