Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation

Author(s):: Thete, A.; Geelen, D. (0000-0003-3571-3898); Molen, S.J. van der (0000-0003-3181-2055); Tromp, R.M.

Published: 2017
Publication type: Article / Letter to editor

Date issued: 2017
Language: English
Is part of: Physical Review Letters (2017), Vol. 119, no. 26, p. 266803
hdl: 1887/57310
doi: 10.1103/PhysRevLett.119.266803