Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime

Author(s):: Tewari, S. (0000-0002-9229-0038); Sabater Piqueres, C. (0000-0001-8586-9976); Kumar, M.; Stahl, S.; Crama, L.; Ruitenbeek, J.M. van (0000-0003-0381-0132)

Published: 2017
Publication type: Article / Letter to editor

Date issued: 2017
Language: English
Is part of: Review of Scientific Instruments (2017), Vol. 88, no. 9, p. 093903
hdl: 1887/56280
doi: 10.1063/1.5003391
URL: https://arxiv.org/abs/1706.02628