Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime

Author(s):
Tewari, S.; Sabater, Piqueres C.; Kumar, M.; Stahl, S.; Crama, L.; Ruitenbeek, J.M. van
Published
2017
Publication type
Article / Letter to editor
Date issued
2017
Is part of
Review of Scientific Instruments (2017), Vol. 88, no. 9, p. 093903
hdl
1887/56198
URL
https://arxiv.org/abs/1706.02628