Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips

Author(s):: Tewari, S. (0000-0002-9229-0038); Bastiaans, K.M. (0000-0002-2871-4166); Allan, M.P. (0000-0002-5437-1945); Ruitenbeek, J.M. van (0000-0003-0381-0132)

Published: 2017
Publication type: Article / Letter to editor

Date issued: 2017
Language: English
Is part of: Beilstein Journal of Nanotechnology (2017), Vol. 8, p. 2389-2395
hdl: 1887/55977
doi: 10.3762/bjnano.8.238
URL: https://www.beilstein-journals.org/bjnano/articles/8/238