Research Update: Reactively sputtered nanometer-thin ZrN film as a diffusion barrier between Al and boron layers for radiation detector applications

Author(s):
Golshani, N.; Mohammadi, V.; Schellevis, H.; Beenakker, C.I.M.; Ishihara, R.
Published
2014
Publication type
Article / Letter to editor
Date issued
2014-10-31
Language
English
Is part of
APL MATERIALS (2014), Vol. 2, no. 10, p. 100702
hdl
1887/55320
doi
10.1063/1.4897959