Topic identification challenge

Author(s):: Boyack, K.; Glänzel, W.; Gläser, J.; Havemann, F.; Scharnhorst, A.; Thijs, B.; Van Eck, N.J.; Van Velden, T.; Waltman, L.R. (0000-0001-8249-1752)

Editor(s):: Van, Eck N.J.; Van, Velden T.

Published: 2017
Publication type: Article / Letter to editor

Date issued: 2017-05-31
Language: English
Is part of: Scientometrics (2017), Vol. 111, no. 2, p. 1223-1224
hdl: 1887/54802
doi: 10.1007/s11192-017-2307-0