A subsurface add-on for standard atomic force microscopes

Author(s):
Verbiest, G.J.; Zalm, D.J. van der; Oosterkamp, T.H. (0000-0001-6855-5190); Rost, M.J.
Published
2015
Publication type
Article / Letter to editor
Date issued
2015
Language
English
Is part of
Review of Scientific Instruments (2015), Vol. 86, p. 033704
hdl
1887/54568
doi
10.1063/1.4915895