Poor electronic screening in lightly doped Mott insulators observed with scanning tunneling microscopy

Author(s):: Battisti, I. (0000-0002-2543-4572); Fedoseev, V. (0000-0001-8688-1635); Bastiaans, K.M. (0000-0002-2871-4166); Torre, Al. de la; Perry, R.S.; Baumberger, F.; Allan, M.P. (0000-0002-5437-1945)

Published: 2017
Publication type: Article / Letter to editor

Date issued: 2017
Language: English
Is part of: Physical Review B : Condensed Matter (2017), Vol. 95, no. 23, p. 235141
hdl: 1887/52984
doi: 10.1103/PhysRevB.95.235141
URL: https://arxiv.org/abs/1703.04492