Fermi surface contours obtained from scanning tunnelling microscope images around surface point defects

Author(s):: Khotkevych, N.V.; Kolesnichenko, Y.A.; Ruitenbeek, J.M. van (0000-0003-0381-0132)

Published: 2013
Publication type: Article / Letter to editor

Date issued: 2013
Language: English
Is part of: New Journal of Physics (2013), Vol. 15, p. 123013
hdl: 1887/50379
doi: 10.1088/1367-2630/15/12/123013