Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance

Author(s):: Voogd, J.M. de; Spronsen, M.A. van (0000-0002-5136-2816); Kalff, F.E.; Bryant, B.; Ostojic, O.; Haan, A.M.J. den; Groot, I.M.N.; Oosterkamp, T.H. (0000-0001-6855-5190); Otte, A.F.; Rost, M.J.

Published: 2017
Publication type: Article / Letter to editor

Date issued: 2017
Language: English
Publisher: Elsevier
Is part of: Ultramicroscopy (2017), Vol. 181, p. 61-69
hdl: 1887/49658
doi: 10.1016/j.ultramic.2017.05.009