Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3

Author(s):: Zhang, Y.Q.; Zhu, Y.; Zhang, Z.D.; Aarts, J. (0000-0002-4113-0835)

Published: 2007
Publication type: Article / Letter to editor

Date issued: 2007
Language: English
Is part of: Journal of Applied Physics (2007), Vol. 101, p. 063919
hdl: 1887/45176
doi: 10.1063/1.2710341