Brain development in adolescents at ultra-high risk for psychosis: Longitudinal changes related to resilience

Author(s):: De Wit, S.; Wierenga, L.M. (0000-0001-9362-563x); Oranje, B.; Ziermans, T.B.; Schothorst, P.F.; Van Engeland, H.; Kahn, R.S.; Durston, S.

Published: 2016
Publication type: Article / Letter to editor

Date issued: 2016
Language: English
Is part of: NeuroImage: Clinical (2016), Vol. 12, p. 542-549
hdl: 1887/45078
doi: 10.1016/j.nicl.2016.08.013
URL: http://www.sciencedirect.com/science/article/pii/S2213158216301498