STM imaging of flux line arrangements in the peak effect regime

Author(s):: Troyanovski, A.M.; Hecke, M.L. van (0000-0002-9550-6607); Saha, N.; Aarts, J. (0000-0002-4113-0835); Kes, P.H.

Published: 2002
Publication type: Article / Letter to editor

Date issued: 2002
Language: English
Is part of: Physical Review Letters (2002), Vol. 89, no. 14, p. 147006
hdl: 1887/44639
doi: 10.1103/PhysRevLett.89.147006